DocumentCode :
2901160
Title :
Low frequency noise in phase change materials
Author :
Jeyasingh, Rakesh ; Chroboczek, J.A. ; Ghibaudo, Gérard ; Mouis, Mireille ; Wong, H. -S Philip
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2011
fDate :
12-16 June 2011
Firstpage :
476
Lastpage :
479
Abstract :
Low frequency noise (LFN) is particularly well-adapted for studies of phase change memory cells as it is generated in the cells´ amorphous volume alone. The latter is known to have a very high concentration of localized traps and the charge transport proceeds via hopping in a random network of traps. LFN is proposed to be generated by variation in the configuration of the traps´ structure. The spectral power density of LFN (i) is of the 1/f type, (ii) varies as the cell current square, (iii) is inversely proportional to the cell thickness. Some results of the LFN dependence on the cells´ resetting conditions and structure are also discussed.
Keywords :
hopping conduction; noise; phase change memories; charge transport; hopping transport; low frequency noise; phase change materials; phase change memory cells; spectral power density; Electrodes; Fluctuations; Noise; Noise measurement; Phase change materials; Phase change memory; Resistance; amorphous phase; low frequency noise; phase change matrials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4577-0189-4
Type :
conf
DOI :
10.1109/ICNF.2011.5994373
Filename :
5994373
Link To Document :
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