A common design and test strategy for merchant ASICs

Author

Vopni, Ed

Author_Institution

Bell-Northern Res., Ottawa, Ont., Canada

fYear

1990

fDate

17-21 Sep 1990

Abstract

An approach to managing the complexities of ASIC design within a telecommunications design and manufacturing company is described. The approach is based on the use of a limited number of approved ASIC vendors, a unified multiple vendor/technology design system, centralized application support, and a central forum for information exchange. The Logic Array Design System (LADS) was developed to provide a consistent design and test methodology across multiple ASIC vendors and technologies

Keywords

application specific integrated circuits; circuit CAD; integrated circuit technology; integrated circuit testing; logic CAD; logic arrays; logic testing; ASIC design; LADS; Logic Array Design System; approved ASIC vendors; central forum; centralized application support; common strategy; design strategy; information exchange; manufacturing company; merchant ASICs; telecommunications design; test strategy; unified multiple vendor/technology design system; Application specific integrated circuits; Design automation; Design methodology; Design optimization; Diversity methods; Product design; Pulp manufacturing; Standards development; System testing; Telecommunications;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE

Conference_Location

Rochester, NY

Type

conf

DOI

10.1109/ASIC.1990.186092

Filename

186092