• DocumentCode
    2901283
  • Title

    Converter-modulator design and operations for the "ILC" l-band test stand

  • Author

    Reass, William A. ; Burkhart, C. ; Adolphsen, C. ; Beukers, T. ; Cassel, R. ; de Lira, A. ; Papas, C. ; Nguyen, M. ; Swent, R. ; Anderson, David E.

  • Author_Institution
    Los Alamos Nat. Lab., Los Alamos
  • fYear
    2007
  • fDate
    25-29 June 2007
  • Firstpage
    2397
  • Lastpage
    2399
  • Abstract
    To facilitate a rapid response to the International Linear Collider (ILC) L-band development program at SLAC, a spare converter-modulator was shipped from LANL. This modulator was to be a spare for the spallation neutron source (SNS) accelerator at ORNL. The ILC application requires a 33% higher peak output power (15 MW) and output current (120 Amp). This presents significant design challenges to modify the existing hardware and yet maintain switching parameters and thermal cycling within the semiconductor component ratings. To minimize IGBT commutation and free-wheeling diode currents, a different set of optimizations, as compared to the SNS design, were used to tune the resonant switching networks. Additional complexities arose as nanocrystalline cores with different performance characteristics (as compared to SNS), were used to fabricate the resonant "boost" transformers. This paper will describe the electrical design, modelling efforts, and resulting electrical performance as implemented for the ILC L-band test stand.
  • Keywords
    beam handling techniques; convertors; electron accelerators; linear colliders; modulators; neutron sources; optimisation; International Linear Collider; ORNL; SLAC; Spallation Neutron Source accelerator; converter-modulator design; electrical design; free-wheeling diode currents; nanocrystalline cores; resonant boost transformers; resonant switching networks; semiconductor component; Design optimization; Hardware; Insulated gate bipolar transistors; L-band; Neutrons; Power generation; Power semiconductor switches; Resonance; Semiconductor diodes; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2007. PAC. IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0916-7
  • Type

    conf

  • DOI
    10.1109/PAC.2007.4441262
  • Filename
    4441262