Title :
Numerical modeling analysis of 0.22 THz sheet beam TWT circuit
Author :
Shin, Young-Min ; Barnett, Larry R. ; Baig, Anisullah ; Luhmann, Neville C., Jr. ; Pasour, John ; Larsen, Paul
Author_Institution :
Dept. of Appl. Sci., Univ. of California-Davis (UCD), Davis, CA, USA
Abstract :
Extensive numerical analysis has resulted in the conclusion that the THz (H-band) sheet beam traveling wave tube (TWT) amplifier circuit, comprised of a staggered double grating array waveguide, has the very broad bandwidth (~ 30 %) of the fundamental passband (TE-mode) with a 7 : 1 aspect ratio sheet beam without excitation of n = 1 space harmonic backward wave modes. Particle-in-cell (PIC) simulations utilizing MAGIC3D and CST PS predict that the designed circuit produces 150 ~ 300 W output power, corresponding to ~ 3-5.5 % intrinsic electronic efficiency (35 ~ 38 dB gain from 50 mW input driving power), over ~ 25 % bandwidth, which are in good agreement with Christine-1D code simulation results. Simulations, using a perfectly matched layer (PML) boundary (~ -30 dB return loss), show the circuit stably operates without noticeable oscillation. With a more realistic matching condition with ~ -9 dB return loss, it becomes unstable. However, simulations show that the incorporation of a sever with tapered conductivity fully suppresses the instability in tube operation.
Keywords :
backward wave tubes; numerical analysis; terahertz wave devices; travelling wave amplifiers; CST PS; Christine-1D code simulation; MAGIC3D; THz sheet beam traveling wave tube amplifier circuit; frequency 0.22 THz; gain 35 dB to 38 dB; instability suppression; numerical modeling analysis; particle-in-cell simulation; perfectly matched layer; power 50 mW; space harmonic backward wave mode; staggered double grating array waveguide; tube operation; Bandwidth; Electron tubes; Integrated circuit modeling; Numerical models; Oscillators; Power generation; Time frequency analysis; H-band; THz; TWT; traveling wave tube;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
DOI :
10.1109/IVEC.2011.5746914