Title :
The microelectronic device selection process
Author :
Blitzer, Frank, Jr. ; Samson, John R.
Author_Institution :
Honeywell Inc., Clearwater, FL, USA
Abstract :
A methodology which has yielded excellent results in identifying critical device needs for complex military systems is described. This methodology is illustrated using examples derived from advanced satellite and other processing system studies. The microelectronic device selection process begins with the identification of mission requirements. The system designer then identifies the system functions necessary to perform the mission and allocates these functions to architectural elements within the system. At some level in this allocation is the processing system (hardware and software). From this point, the synthesis of possible processing concepts and configurations is initiated. This iterative process includes functional, technology, and packaging trade studies which establish the parameters of the trade space(s) involved and identify design sensitivities. From these analyses, the designer and his customer identify tradeoff criteria so that the lower level trades can be made to isolate technology needs. These needs may be satisfied with mature technology or, if schedule permits, the development of new or maturing technology. The key elements of this selection process are technology and risk assessment. Particular emphasis is placed on these two aspects of the process
Keywords :
application specific integrated circuits; equipment selection (computers); military equipment; systems engineering; complex military systems; design sensitivities; identifying critical device needs; iterative design process; iterative process; microelectronic device selection process; mission requirements identification; packaging; processing system; processing system studies; risk assessment; system functions requirements; technology assessment; tradeoff criteria; Application specific integrated circuits; Electronic switching systems; Hardware; Integrated circuit technology; Isolation technology; Microelectronics; Process design; Risk management; Satellites; Space technology;
Conference_Titel :
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1990.186111