مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2901523

Title :

Wafer Level Autoclave

Author :

Matosevich, Aviram ; Lisenker, Boris

Author_Institution :

National Semiconductor

fYear :

1992

fDate :

25-28 Oct. 1992

Firstpage :

167

Lastpage :

168

Keywords :

Acceleration; Corrosion; Moisture; Packaging; Passivation; Qualifications; Resists; Stress; Testing; Wafer scale integration;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Wafer Level Reliability Workshop, 1992. Final Report., 1992 International

Conference_Location :

Lake Tahoe, CA, USA

Type :

conf

DOI :

10.1109/IWLR.1992.658001

Filename :

658001

Link To Document :