Title :
1999 4th International Workshop on Statistical Metrology (Cat. No.99TH8391)
Abstract :
The following topics wre covered: IC technology R&D for the Next Century; circuit/interconnects variability; clock skew determination; circuit performance variability decomposition; impact of intra-die variance on clock skew; fault diagnosis of analog ICs; yield analysis; and defect analysis
Keywords :
fault diagnosis; inspection; integrated circuit interconnections; integrated circuit measurement; integrated circuit yield; statistical analysis; IC technology R&D; analog ICs; circuit performance variability decomposition; circuit variability; clock skew determination; defect analysis; fault diagnosis; interconnects variability; statistical metrology; yield analysis;
Conference_Titel :
Statistical Metrology, 1999. IWSM. 1999 4th International Workshop on
Conference_Location :
Kyoto, Japan
Print_ISBN :
0-7803-5154-1
DOI :
10.1109/IWSTM.1999.773181
