DocumentCode :
2901585
Title :
Monte Carlo simulation of a finite thickness neutralized electron beam
Author :
Parmar, Nidhi ; Deshpande, P. ; Choyal, Y. ; Bhat, K.S.
Author_Institution :
Sch. of Phys., D.A. Univ., Indore, India
fYear :
2011
fDate :
21-24 Feb. 2011
Firstpage :
175
Lastpage :
176
Abstract :
Cyclotron resonance maser (CRM) instability1-2 is characterized by the oscillation condition ω >;Ω̃ + kzVz, where the Doppler-shift term kzVz in the fast electron cyclotron mode ω =Ω̃ + kzVz is negligibly small. Here, ω, kz, Ω̃ = eB0/mγ0 and Vz are, respectively, angular frequency and wavenumber of oscillation, relativistic cyclotron frequency and beam velocity in the axial direction; whereas -e, B0, m, and γ0 are respectively, the charge on the electron, axial magnetic field, mass of the electron, and the relativistic factor. The CRM instability, however, may not be the unique principle of cyclotron emission near Ω̃. Another principle of cyclotron emission different from the CRM instability was found to exist theoretically, if high-density electron beams were neutralized by ions3-4. It was named Cherenkov instability in azimuthal direction (CIAD) that was expected to arise at an oscillation frequency ω <; Ω̃. It was shown that the instability is non-relativistic principle of cyclotron emission in fast wave device region, namely, ω/kz >; c. Here, c is the velocity of light in vacuum.
Keywords :
Cherenkov radiation; Monte Carlo methods; cyclotron masers; electron beams; Cherenkov instability in azimuthal direction; Doppler-shift term; Monte Carlo simulation; beam velocity; cyclotron emission; cyclotron resonance maser instability; finite thickness neutralized electron beam; relativistic cyclotron frequency; relativistic factor; Cyclotrons; Electron beams; Force; Ions; Magnetic fields; Masers; Oscillators; Cherenkov instability in azimuthal direction; Large orbit beam; Neutralized beam; cyclotron resonance maser instability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
Type :
conf
DOI :
10.1109/IVEC.2011.5746932
Filename :
5746932
Link To Document :
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