• DocumentCode
    2901641
  • Title

    Evaluation of the coherence of electron beam from low temperature field emitter

  • Author

    Kobayashi, W. ; Cho, B. ; Ishikawa, T. ; Rokuta, E. ; Oshima, C.

  • Author_Institution
    Dept. of Appl. Phys., Waseda Univ., Tokyo, Japan
  • fYear
    2004
  • fDate
    6-10 Sept. 2004
  • Firstpage
    283
  • Abstract
    Summary form only given. Multi-walled carbon nanotubes (MWCNT) have been known to function as nano-biprism in projection microscope. Here we measure the transverse coherence length (Lt) of electron beam (e-beam) from tungsten field emitter by using the nano-biprism. A MWCNT is irradiated by an e-beam radially propagating from a field emitter and its magnified image is projected on the screen. Tip approach enlarges the image and beautiful interference patterns always show up as shown. With decreasing the source temperature from RT to 78K, the visibility of the interference fringe increases by a factor of 3, and the bandwidth of interference pattern widens by a factor of 5. This enhancement of coherence with temperature fall strongly suggests the direct relationship between the coherences of electronic state inside the field emitter and e-beam. Now we are preparing experiments at liquid helium temperature with conventional tungsten tips and superconducting niobium tips, which will provide further enhancement of the coherence of e-beam.
  • Keywords
    carbon nanotubes; coherence; electron beams; electron field emission; interference; optical prisms; tungsten; W; electron beam coherence; electronic state; interference fringe; interference patterns; liquid helium temperature; low temperature field emitter; multi-walled carbon nanotubes; nano-biprism; radial propagation; transverse coherence length; tungsten field emitter; Bandwidth; Carbon nanotubes; Coherence; Electron beams; Helium; Interference; Length measurement; Microscopy; Temperature; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
  • Print_ISBN
    0-7803-8437-7
  • Type

    conf

  • DOI
    10.1109/IVESC.2004.1414238
  • Filename
    1414238