DocumentCode
2902027
Title
JTAG and Hitachi´s autodiagnosis
Author
Souza, Daniel D.
Author_Institution
Hitachi America Ltd., Brisbane, CA, USA
fYear
1990
fDate
17-21 Sep 1990
Abstract
The autodiagnosis technique that uses scan design is described and its relation to the IEEE Joint Test Action Group (JTAG) boundary scan is pointed out. The similarities between autodiagnosis and the JTAG boundary scan are emphasized. JTAG and the tradeoffs in such a conversion are discussed
Keywords
application specific integrated circuits; built-in self test; digital integrated circuits; integrated circuit testing; logic testing; BIST; Hitachi´s autodiagnosis; IEEE; JTAG; JTAG boundary scan; Joint Test Action Group; autodiagnosis technique; scan design; similarities; tradeoffs; Automatic control; Automatic testing; Circuit faults; Circuit testing; Clocks; Latches; Pins; Samarium; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1990.186152
Filename
186152
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