Title :
Direct access test scheme-implementation and verification in embedded ASIC designs
Author :
Immaneni, V. ; Puffer, David ; Raman, Srinivas
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
The direct access test scheme (DATS) that eliminates the designer´s burden of embedded block cell test generation is discussed. This scheme provides for testing of embedded block cells using proven test vectors. The implementation and automatic verification of DATS in ASIC designs is discussed
Keywords :
application specific integrated circuits; integrated circuit testing; logic testing; automatic verification; block cell test generation; direct access test scheme; embedded ASIC designs; logic block testing; Amplitude shift keying; Application specific integrated circuits; Automatic testing; Libraries; Logic design; Logic testing; Microcomputers; Microprocessors; Packaging; Pins;
Conference_Titel :
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1990.186177
