DocumentCode
2902441
Title
Characterization of ASIC performance via application specific test engineering
Author
Chrusciel, Richard W.
Author_Institution
ETEC Inc., West Peabody, MA, USA
fYear
1990
fDate
17-21 Sep 1990
Abstract
Some of the benefits of customer- and application-specific characterization of ASICs are discussed. The author discusses why ASIC device performance is characterized. An example of characterization data is presented for a CMOS gate array. The benefits of having this data are given. A cost analysis of using contract test engineering services to provide this data is presented
Keywords
application specific integrated circuits; integrated circuit testing; ASIC device performance; CMOS gate array; application specific test engineering; contract test engineering services; cost analysis; Application specific integrated circuits; Computer aided manufacturing; Contracts; Costs; Data engineering; Performance evaluation; Production systems; Prototypes; Software tools; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location
Rochester, NY
Type
conf
DOI
10.1109/ASIC.1990.186179
Filename
186179
Link To Document