Title :
ASIC VLSI design and development in MOSart-a focus on logic analysis and automated test vector generation
Author :
Criado, A. Roberto
Author_Institution :
ABB HAFO Inc., San Diego, CA, USA
Abstract :
The MOSart comprehensive CAD/CAE system for the design and development of cell-based ASICs and full custom VLSI circuits. The MOSart design environment encompasses a wide variety of applications, i.e. design tools with which a design team can implement an ASIC. The computer-aided-engineering capabilities of MOSart through which the analysis of simulation results, along with the automated generation of ATE-compatible test vector patterns, are obtained. Three of MOSart´s application tools, namely, VECTORGEN, SIMGEN and LAS, are considered. VECTORGEN and SIMGEN are application tools developed specifically to assist with the task of verifying a given ASIC design. With the aid of VECTORGEN and SIMGEN, simulator stimuli and the creation of ATE-compatible test vector patterns are accomplished. LAS (logic analysis system) provides systematic and automated procedures that facilitate the analysis of the behavior of a given logic block including the top level block of a completed design
Keywords :
VLSI; application specific integrated circuits; automatic testing; circuit CAD; integrated circuit testing; integrated logic circuits; logic CAD; logic testing; ASIC VLSI design; ATE-compatible test vector patterns; CAD/CAE system; LAS; MOSart; SIMGEN; VECTORGEN; application tools; automated test vector generation; cell-based ASICs; computer aided design; computer-aided-engineering; design environment; design tools; full custom VLSI circuits; logic analysis; logic analysis system; Analytical models; Application software; Application specific integrated circuits; Circuit simulation; Computational modeling; Computer aided engineering; Design automation; Logic design; Pattern analysis; Very large scale integration;
Conference_Titel :
ASIC Seminar and Exhibit, 1990. Proceedings., Third Annual IEEE
Conference_Location :
Rochester, NY
DOI :
10.1109/ASIC.1990.186181