Title :
Experimental verification of the performance of a depressed collector for a linear beam tube
Author :
Kumar, S. Senthil ; Shankarappa, V. ; Rao, P. Raja Ramana ; Datta, S.K. ; Prasad, Srinivasa
Author_Institution :
Microwave Tube Div., Bharat Electron., Bangalore, India
Abstract :
This paper describes the simulation of a single stage depressed collector using PIERCE and CST Studio including secondary electron emission effects. This collector was developed and integrated with a linear beam tube. The experimental efficiency of the collector agrees well with the simulated efficiency of the collector. The thermal analysis of the collector also has been carried out using ANSYS and agrees well with the measurements.
Keywords :
electron emission; microwave tubes; ANSYS; CST Studio; PIERCE; depressed collector; linear beam tube; secondary electron emission effect; thermal analysis; Electron emission; Electron tubes; Finite element methods; Mathematical model; Radio frequency; Thermal analysis; Trajectory; CST Studio; Depressed collector; Linear Beam Tube; PIERCE; axis-symmetric collector; secondary electron emission;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
DOI :
10.1109/IVEC.2011.5746986
