• DocumentCode
    2903106
  • Title

    Thermal Numerical Simulation and Correlation for a Power Package

  • Author

    Yuan, Zhongfa ; Liu, Yong ; Irving, Scott ; Luk, Timwah ; Zhang, Jiangyuan

  • Author_Institution
    Fairchild Semicond. Corp., Suzhou
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Thermal resistance is sensitive to package structure, package material, thermal test board and ambient conditions. In this paper, a power package (D2PAK), with natural convection is studied. For the thermal test board, the special designed boards called "MINI Pad" board and "One Square Inch" board for power application are employed based on actual thermal testing. A testing procedure of thermal resistance theta JA for TO serial power products is introduced. Several factors in this procedure, such as the connection wires, socket and interface board are studied and discussed in order to reduce the heat loss by the connection fixtures which are not involved in FEA models. In the simulations, constant empirical heat transfer convection coefficient and temperature-dependent of it are applied on the FEA models separately as boundary conditions, and then the correlation from the simulation results to the measurements is examined. It is found that temperature-dependent formula of heat transfer coefficient is more reasonable for thermal simulation.
  • Keywords
    finite element analysis; natural convection; power semiconductor devices; semiconductor device packaging; semiconductor device testing; thermal management (packaging); D2PAK; FEA models; MINI Pad board; One Square Inch board; heat transfer convection coefficient; natural convection; package material; package structure; power package; temperature-dependent formula; thermal numerical simulation; thermal resistance; thermal test board; thermal testing; Calibration; Electrical resistance measurement; Numerical simulation; Semiconductor device packaging; Temperature; Testing; Thermal factors; Thermal management; Thermal resistance; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441399
  • Filename
    4441399