DocumentCode
2903189
Title
Near-field characterization of photonic crystal components
Author
Volkov, Valentyn S. ; Bozhevolnyi, Sergey I. ; Borel, Peter I. ; Frandsen, Lars H. ; Kristensen, Martin
Author_Institution
Dept. of Phys. & Nanotechnol., Aalborg Univ.
fYear
2005
fDate
17-17 June 2005
Firstpage
603
Lastpage
603
Abstract
In this paper, we have employed a collection scanning near-field optical microscope (SNOM) for imaging of the propagation of light at telecommunication wavelengths along straight and bent photonic crystal (PC) waveguides with Y-splitters, Z-bends and simple couplers that were fabricated on silicon-on-insulator (SOl) wafers
Keywords
near-field scanning optical microscopy; optical beam splitters; optical couplers; optical materials; optical waveguides; photonic crystals; silicon-on-insulator; SNOM; Si-SiO2; Y-splitters; bent photonic crystal waveguides; light propagation; optical couplers; scanning near-field optical microscope; silicon-on-insulator wafers; straight photonic crystal waveguides; Optical devices; Optical fiber couplers; Optical films; Optical interferometry; Optical polarization; Optical propagation; Optical waveguide theory; Optical waveguides; Personal communication networks; Photonic crystals;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2005. CLEO/Europe. 2005 Conference on
Conference_Location
Munich
Print_ISBN
0-7803-8974-3
Type
conf
DOI
10.1109/CLEOE.2005.1568379
Filename
1568379
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