• DocumentCode
    2903230
  • Title

    A hybrid ferroelectric and charge nonvolatile memory

  • Author

    Rajwade, Shantanu R. ; Auluck, Kshitij ; Shaw, Jonathan ; Lyon, Keith ; Kan, Edwin C.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    2011
  • fDate
    20-22 June 2011
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    We introduce a new nonvolatile memory that incorporates ferroelectric (FE) switching layer and charge-storage floating node in a single gate stack. This hybrid FE-charge design reduces the depolarization field in the FE layer as well as increases the memory window over conventional FE-FET. The magnitude of the electric field in the tunnel dielectric is reduced at retention and enhanced at program/erase from the FE polarization. This paper discusses the working principle, gate stack design, fabrication and experimental results of this hybrid design compared to FE-FET and charge-trap Flash.
  • Keywords
    ferroelectric storage; random-access storage; charge-storage floating node; depolarization field; ferroelectric switching layer; hybrid ferroelectric and charge nonvolatile memory; memory window; single gate stack; tunnel dielectric; Fabrication; Films; Iron; Logic gates; Switches; X-ray scattering; ferroelectric; gate injected charge; hybrid memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2011 69th Annual
  • Conference_Location
    Santa Barbara, CA
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-61284-243-1
  • Electronic_ISBN
    1548-3770
  • Type

    conf

  • DOI
    10.1109/DRC.2011.5994474
  • Filename
    5994474