Title : 
A hybrid ferroelectric and charge nonvolatile memory
         
        
            Author : 
Rajwade, Shantanu R. ; Auluck, Kshitij ; Shaw, Jonathan ; Lyon, Keith ; Kan, Edwin C.
         
        
            Author_Institution : 
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
         
        
        
        
        
        
            Abstract : 
We introduce a new nonvolatile memory that incorporates ferroelectric (FE) switching layer and charge-storage floating node in a single gate stack. This hybrid FE-charge design reduces the depolarization field in the FE layer as well as increases the memory window over conventional FE-FET. The magnitude of the electric field in the tunnel dielectric is reduced at retention and enhanced at program/erase from the FE polarization. This paper discusses the working principle, gate stack design, fabrication and experimental results of this hybrid design compared to FE-FET and charge-trap Flash.
         
        
            Keywords : 
ferroelectric storage; random-access storage; charge-storage floating node; depolarization field; ferroelectric switching layer; hybrid ferroelectric and charge nonvolatile memory; memory window; single gate stack; tunnel dielectric; Fabrication; Films; Iron; Logic gates; Switches; X-ray scattering; ferroelectric; gate injected charge; hybrid memory;
         
        
        
        
            Conference_Titel : 
Device Research Conference (DRC), 2011 69th Annual
         
        
            Conference_Location : 
Santa Barbara, CA
         
        
        
            Print_ISBN : 
978-1-61284-243-1
         
        
            Electronic_ISBN : 
1548-3770
         
        
        
            DOI : 
10.1109/DRC.2011.5994474