DocumentCode :
2903230
Title :
A hybrid ferroelectric and charge nonvolatile memory
Author :
Rajwade, Shantanu R. ; Auluck, Kshitij ; Shaw, Jonathan ; Lyon, Keith ; Kan, Edwin C.
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
fYear :
2011
fDate :
20-22 June 2011
Firstpage :
169
Lastpage :
170
Abstract :
We introduce a new nonvolatile memory that incorporates ferroelectric (FE) switching layer and charge-storage floating node in a single gate stack. This hybrid FE-charge design reduces the depolarization field in the FE layer as well as increases the memory window over conventional FE-FET. The magnitude of the electric field in the tunnel dielectric is reduced at retention and enhanced at program/erase from the FE polarization. This paper discusses the working principle, gate stack design, fabrication and experimental results of this hybrid design compared to FE-FET and charge-trap Flash.
Keywords :
ferroelectric storage; random-access storage; charge-storage floating node; depolarization field; ferroelectric switching layer; hybrid ferroelectric and charge nonvolatile memory; memory window; single gate stack; tunnel dielectric; Fabrication; Films; Iron; Logic gates; Switches; X-ray scattering; ferroelectric; gate injected charge; hybrid memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2011 69th Annual
Conference_Location :
Santa Barbara, CA
ISSN :
1548-3770
Print_ISBN :
978-1-61284-243-1
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2011.5994474
Filename :
5994474
Link To Document :
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