• DocumentCode
    2903280
  • Title

    Lead Profile Optimization and Stress Analysis for Hermetic Metal Package

  • Author

    Lin Xue ; Songliang Jia ; Jian Cai

  • Author_Institution
    Tsinghua Univ., Beijing
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Glass seal is commonly utilized in hermetic metal package to assure hermeticity and protect electronic devices. However large stresses may exist in glass seal and induce failure or cracks. To reduce stresses, lead profile is optimized and stepped leads are utilized in metal packages of TO-254A. Stresses in glass seals were simulated and investigated using ANSYS. Simulation results showed that maximum tensile stress and maximum compression stress for packages with stepped leads are about 1~3% of that of packages with conventional leads. Furthermore, lead integrity experiments were carried out and simulation results were validated. Lead integrity experiments showed that no cracks were found in metal packages with stepped leads but failure occurred in other metal packages with conventional leads. And seal tests indicated that measured leak rate of packages with stepped leads was quite low, smaller than 1 x 10-3 Pa cm3 /s, while the leakage rate was about (2.0 ~ 6.0) x 10-2 Pa cm3 /s for metal packages with conventional leads. Both simulation and experimental results demonstrate that stepped leads are critical to reduce stresses and enhance the reliability of hermetic metal packages.
  • Keywords
    hermetic seals; lead; stress analysis; tensile strength; ANSYS; TO-254A; compression stress; glass seal; hermetic metal package; lead integrity; lead profile optimization; metal packages; seal tests; stepped leads; stress analysis; tensile stress; Electronic packaging thermal management; Electronics packaging; Glass; Lead; Microelectronics; Pins; Seals; Tensile stress; Testing; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441410
  • Filename
    4441410