مرکز منطقه ای اطلاع رساني علوم و فناوري - Customer and Summary Report Management Acceptance Of Bir Group Discussion

DocumentCode :

2903506

Title :

Customer and Summary Report Management Acceptance Of Bir Group Discussion

Author :

Crook, Danny

fYear :

1992

fDate :

25-28 Oct. 1992

Firstpage :

233

Lastpage :

237

Keywords :

Conductors; Engineering management; Manufacturing; Reliability engineering; Testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Wafer Level Reliability Workshop, 1992. Final Report., 1992 International

Conference_Location :

Lake Tahoe, CA, USA

Type :

conf

DOI :

10.1109/IWLR.1992.658011

Filename :

658011

Link To Document :