Title :
A BIC Sensor Capable of Adjusting IDDQ Limit in Tests
Author :
Nakanishi, Masato ; Hashizume, Masaki ; Yotsuyanagi, Hiroyuki ; Miura, Yukiya
Author_Institution :
Dept. of Comput. Syst. Eng., Tokushima Univ.
Abstract :
A built-in-current sensor (BIC sensor) is proposed whose IDDQ limit is able to be adjusted in each IC test. IDDQ tests of identical IDDQ limit can be realized with the current sensor, even if process variation occurs in the sensor. Also, an IDDQ test method is proposed for ICs, in each of which the BIC sensor is implemented. It is shown by some experiments that IDDQ limit of 10mu A will be able to be set and IDDQ test results based on the limit will be obtained by adjusting the limit for each IC if size variation of MOSs in the BIC sensor is less than 50%
Keywords :
MOS integrated circuits; electric current measurement; integrated circuit testing; logic testing; sensors; 10 muA; IC test; IDDQ limit; IDDQ test method; MOS; built-in-current sensor; process variation; CMOS integrated circuits; CMOS logic circuits; Circuit testing; Current supplies; Electronic equipment testing; Integrated circuit testing; Logic testing; Sensor systems; System testing; Tin;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260995
