DocumentCode :
2903570
Title :
An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains
Author :
Lv, Tao ; Liu, Ling-yi ; Zhao, Yang ; Li, Hua-wei ; Li, Xiao-wei
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
fYear :
2006
fDate :
20-23 Nov. 2006
Firstpage :
89
Lastpage :
94
Abstract :
In this paper we propose an observability branch coverage metric (OBCM) based on dynamic factored use-define chains, along with its evaluation method. This technique exploits the efficiency of data-flow analysis rather than methods like fault simulation. Hence it can be easily integrated into HDL compilers or simulators. Experimental results show that OBCM can provide more meaningful coverage data for functional verification than traditional branch coverage metric (BCM)
Keywords :
automatic test pattern generation; data flow analysis; formal verification; hardware description languages; HDL compilers; data flow analysis; dynamic factored use-define chains; fault simulation; functional verification; observability branch coverage metric; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computers; Data analysis; Hardware design languages; Logic circuits; Observability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
ISSN :
1081-7735
Print_ISBN :
0-7695-2628-4
Type :
conf
DOI :
10.1109/ATS.2006.260998
Filename :
4030746
Link To Document :
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