Title :
An Observability Branch Coverage Metric Based on Dynamic Factored Use-Define Chains
Author :
Lv, Tao ; Liu, Ling-yi ; Zhao, Yang ; Li, Hua-wei ; Li, Xiao-wei
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing
Abstract :
In this paper we propose an observability branch coverage metric (OBCM) based on dynamic factored use-define chains, along with its evaluation method. This technique exploits the efficiency of data-flow analysis rather than methods like fault simulation. Hence it can be easily integrated into HDL compilers or simulators. Experimental results show that OBCM can provide more meaningful coverage data for functional verification than traditional branch coverage metric (BCM)
Keywords :
automatic test pattern generation; data flow analysis; formal verification; hardware description languages; HDL compilers; data flow analysis; dynamic factored use-define chains; fault simulation; functional verification; observability branch coverage metric; Analytical models; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computers; Data analysis; Hardware design languages; Logic circuits; Observability;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260998