Title :
A Functional Fault Model with Implicit Fault Effect Propagation Requirements
Author :
Pomeranz, Irith ; Patil, Srinivas ; Parvathala, Praveen K.
Author_Institution :
Sch. of ECE, Purdue Univ., W. Lafayette, IN
Abstract :
We define a functional fault model that does not include explicit fault effect propagation requirements. Test generation for this functional fault model is done considering only a fault free circuit. This simplifies the functional test generation process. We demonstrate through experimental results that functional test sequences generated based on this model are effective in providing very high gate-level stuck-at fault coverage
Keywords :
automatic test pattern generation; fault diagnosis; finite state machines; integrated circuit testing; fault effect propagation requirements; fault free circuit; functional fault model; functional test generation process; gate-level stuck-at fault coverage; test sequences generated; Benchmark testing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Observability; Sequential circuits;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260999
