Title :
Influence of Os-Ru coating on closed-space diode tests of M-Type dispenser cathodes
Author :
Swartzentruber, P. ; Balk, T.J. ; Roberts, S.
Author_Institution :
Dept. of Chem. & Mater. Eng., Univ. of Kentucky, Lexington, KY, USA
Abstract :
Life testing of M-Type dispenser cathodes was performed for 1000 hours to help quantify the performance enhancement due to different osmium-ruthenium (Os-Ru) thin film microstructures. Os-Ru film microstructures were selected based on their potential to inhibit tungsten/Os-Ru interdiffusion as identified in previous studies. The results show that the 10 W substrate biased 150 nm thick film yielded a very stable knee temperature throughout its life. However, the knee temperature was high in comparison to the standard Semicon film.
Keywords :
cathodes; coatings; osmium; ruthenium; thin films; M-Type dispenser cathode; Os-Ru; Os-Ru coating; Os-Ru film microstructure; closed-space diode test; interdiffusion; osmium-ruthenium; thin film microstructure; Barium; Cathodes; Coatings; Films; Knee; Microstructure; Tungsten; M-coating; M-type; dispenser cathode; knee temperature; microstructure; osmium; ruthenium; thin film;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
DOI :
10.1109/IVEC.2011.5747045
