DocumentCode
2903716
Title
An Application of IDD Spectrum Testing Method to the Fault Analysis
Author
Sakaguchi, Kazuhiro
Author_Institution
NEC Electronics Corporation
fYear
2006
fDate
20-23 Nov. 2006
Firstpage
127
Lastpage
127
Abstract
IDDQ information is very useful to localize faults in a LSI. But it is time consuming to discover test vectors which induce abnormal IDDQ. Since the IDD spectrum testing method can detect abnormal supply current easily, we can acquire the test vector information in a short time by the method. An application of the method is introduced and we show experimental results
Keywords
integrated circuit testing; large scale integration; vectors; IDD spectrum testing; IDDQ information; LSI; fault analysis; localize faults; supply current; test vectors; Current measurement; Current supplies; Electronic equipment testing; Fault detection; Fault diagnosis; Frequency; Information analysis; Large scale integration; National electric code; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.261005
Filename
4030753
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