• DocumentCode
    2903806
  • Title

    Melting Temperature and Physical Properties of Sn-Ag-Cu-Mg Lead-Free Solders Based on Uniform Design

  • Author

    Lu, Sheng ; Wang, Baohua ; Wei, Chenggang ; Chen, Jing ; Wang, Weijun

  • Author_Institution
    Jiangsu Univ. of Sci. & Technol., Zhenjiang
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this paper, Sn-Ag-Cu-Mg lead-free solders based on an eutectic Sn-Ag-Cu alloy were prepared by means of uniform design. Further investigations were carried out in aspects of melting, wettability, thermal stability and other physical properties employing differential thermal analysis (DTA), X-ray diffraction (XRD), etc. It is showed that the melting temperatures decrease when the element of Mg was added in the ternary Sn-Ag-Cu solder alloy systems, and the ranges of melting temperature are wider for those solders with lower melting points. For Sn-Ag-Cu-Mg solders, the melting range with less Mg addition is wider, while its melting point is lower. The wettability of the solders is associated with the Mg concentration. With the Mg content ranged from 0.1% to 0.7% , the spreading areas of Sn-Ag-Cu-Mg solders are only 50-70% of that of the near-eutectic Sn-4.0Ag-0.5Cu. With the added Mg, the thermal stability of solders is depressed, while the density and electrical conductivity are as same as those of Sn-4.0Ag-0.5Cu.
  • Keywords
    X-ray diffraction; copper alloys; differential thermal analysis; electrical conductivity; electronics packaging; eutectic alloys; magnesium alloys; materials preparation; melting; silver alloys; solders; thermal stability; tin alloys; wetting; DTA; SnAgCuMg; X-ray diffraction; XRD; differential thermal analysis; electrical conductivity; eutectic alloy; lead-free solders; melting temperature; physical properties; ternary solder alloy systems; thermal stability; wettability; Atmosphere; Composite materials; Environmentally friendly manufacturing techniques; Lead; Temperature distribution; Testing; Thermal conductivity; Thermal stability; Tin; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441440
  • Filename
    4441440