• DocumentCode
    2903841
  • Title

    Thermal Profiling to Overcome Flux Residue Formation in a No-clean Solder Paste for Lead-free Surface Mount Technology

  • Author

    Buenaflor, Leah ; Dal, Sheila Liza ; Estinozo, Ian

  • Author_Institution
    Intel Technol. Philippines, Inc., Cavite
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents the behavior of SnAgCu (SAC) solder paste when analyzed using thermal profiling when exposed to (1) conventional reflow and (2) newly adjusted profiles. Thermal gravimetric analyzer (TGA) was used extensively to study the thermal properties of the flux and to simulate the heating processes the material undergoes during ball-attach reflow process. Experiments have proved that slower ramp rate will allow gradual evaporation of volatiles prior the non-volatile reaction of flux material at soak zone. This understanding of the reaction that takes place prior to soak zone will enable ball-attach engineers to reduce the residue contamination on the ball surface by preventing the amount of solid components to be dragged atop the ball surface during rapid outgassing of solvents at a faster pre-heat ramp rate.
  • Keywords
    copper alloys; outgassing; process heating; reflow soldering; silver alloys; surface contamination; surface mount technology; thermal analysis; tin alloys; SnAgCu; ball-attach reflow process; conventional reflow; flux material; flux residue formation; flux thermal properties; heating process simulation; lead-free surface mount technology; preheat ramp rate; residue contamination; solder paste; solvents rapid outgassing; thermal gravimetric analyzer; thermal profiling; volatiles gradual evaporation; Chemistry; Environmentally friendly manufacturing techniques; Lead; Resins; Soldering; Solids; Solvents; Surface contamination; Surface-mount technology; Testing; Ball Attach; Flux; NCF; Reflow;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441442
  • Filename
    4441442