Title :
ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs
Author :
Karimi, Naghmeh ; Mirkhani, Shahrzad ; Navabi, Zainalabedin
Author_Institution :
Electr. & Comput. Eng. Dept., Tehran Univ.
Abstract :
This paper proposes a novel and efficient method for RT level online testing. Our method makes every RT-level resource online-testable, and guarantees high single stuck-at fault detection (i.e., high reliability) with low area/latency overhead. This method uses available resources in their dead intervals (the intervals during which a resource is not being used) to test active resources. The area and/or latency overhead are due to concurrent operation of active and inactive resources. This method is evaluated by fault simulating several benchmark designs before and after applying the proposed algorithm. Experimental results show that after applying our method, online fault coverage is significantly improved
Keywords :
fault simulation; integrated circuit reliability; integrated circuit testing; logic testing; ESTA method; RT level online testing; RT-level designs; area overhead; dead intervals; fault simulation; latency overhead; online fault coverage; reliability enhancement; stuck-at fault detection; Circuit faults; Circuit testing; Delay; Design engineering; Electrical fault detection; Error correction codes; Hardware; Reliability engineering; Sequential circuits; Voting;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261020