DocumentCode :
2904048
Title :
The influence of surface modification on the electrical properties of silicon carbide flakes
Author :
Plesa, Ilona ; Schlogl, Sandra ; Radl, Simone Viola ; Muhlbacher, Inge ; Schichler, Uwe
Author_Institution :
Polymer Competence Center Leoben GmbH, Leoben, Austria
fYear :
2015
fDate :
7-9 May 2015
Firstpage :
460
Lastpage :
463
Abstract :
Field grading materials with nonlinear behaviour are used in many high voltage applications to avoid any stress concentration that can deteriorate the material performance. In the present work, the current-voltage characteristics of surface functionalized silicon carbide (SiC) flakes were studied and compared to untreated particles. The nonlinear behavior of SiC flakes can be described by transport mechanisms at the grain contact, which can be modeled by Schottky-like barriers. The influence of the organic surface layer on the conduction mechanisms and the corresponding electrical properties were evaluated. In addition, physico-chemical analysis, including X-ray photoelectron spectroscopy (XPS), optical microscopy and zeta-potential measurements were accomplished in order to analyze the surface properties of the SiC flakes, prior to and after surface modification.
Keywords :
Schottky barriers; X-ray photoelectron spectra; electrokinetic effects; optical microscopy; silicon compounds; surface treatment; Schottky like barriers; SiC; X-ray photoelectron spectroscopy; current-voltage characteristics; field grading materials; grain contact; optical microscopy; physicochemical analysis; silicon carbide flakes; stress concentration; surface modification; transport mechanisms; zeta potential measurements; Atmospheric measurements; Chemicals; Electrodes; Powders; Silicon carbide; Surface morphology; Surface treatment; Current-Voltage Characteristics; Optical Microscopy; Organic Layer; Silicon Carbide; Surface Functionalization; X-ray Photoelectron Spectroscopy; Zeta-Potential Measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Topics in Electrical Engineering (ATEE), 2015 9th International Symposium on
Conference_Location :
Bucharest
Type :
conf
DOI :
10.1109/ATEE.2015.7133858
Filename :
7133858
Link To Document :
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