Title :
The problem of diagnostics of electronics and plasma units
Author :
Kovalenko, Yu A. ; Korolev, D.S.
Author_Institution :
State Sci. Center Russian Federation, Fed. State Unitary Enterprise All-Russia Electron. Tech. Inst. Named After V.I. Lenin (FGUP VEI), Moscow, Russia
Abstract :
This is to propose a method for determining the heterogeneity emission based on the analysis of Schottky plot of saturation. It is shown that the problem of determining the emission heterogeneity is ill-posed problems and requires for its solution some prior information about the nature of the solution. Since the current emission equation is described by the Fredholm-1st kind of convolution type, the solution of the inverse problem described by the Tikhonov functional, whose solution for a fixed regularization parameter can be found in closed form by Fourier transformation.
Keywords :
Fourier transforms; electron emission; integral equations; plasma diagnostics; Fourier transformation; Fredholm 1st kind equation; Schottky plot of saturation; Tikhonov functional; convolution equation; electronic unit diagnostics; emission heterogeneity; heterogeneous emission; inverse problem; plasma unit; Accuracy; Convolution; Equations; Inverse problems; Plasmas; Probes; Region 8; Fredholm equation; Shottky plot; distribution; emission; work function;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2011 IEEE International
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-8662-5
DOI :
10.1109/IVEC.2011.5747068