• DocumentCode
    2904170
  • Title

    Test Generation for Weak Resistive Bridges

  • Author

    Irajpour, Shahdad ; Gupta, Sandeep K. ; Breuer, Melvin A.

  • Author_Institution
    Dept. of EE, Southern California Univ., Los Angeles, CA
  • fYear
    2006
  • fDate
    Nov. 2006
  • Firstpage
    265
  • Lastpage
    272
  • Abstract
    An approach for testing weak resistive bridge targets is developed. The approach is based on defining and generating tests for a set of surrogates associated with each target. Either no or limited timing information is used during test generation. Experimental results show much higher coverage of targets and much lower complexity compared to those for crosstalk targets
  • Keywords
    automatic test pattern generation; bridge circuits; circuit testing; logic testing; crosstalk targets; test generation; weak resistive bridges testing; Bridge circuits; Circuit faults; Circuit testing; Crosstalk; Delay; Logic testing; Runtime; Semiconductor device testing; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.261030
  • Filename
    4030778
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2904170