Title :
Test Generation for Weak Resistive Bridges
Author :
Irajpour, Shahdad ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Dept. of EE, Southern California Univ., Los Angeles, CA
Abstract :
An approach for testing weak resistive bridge targets is developed. The approach is based on defining and generating tests for a set of surrogates associated with each target. Either no or limited timing information is used during test generation. Experimental results show much higher coverage of targets and much lower complexity compared to those for crosstalk targets
Keywords :
automatic test pattern generation; bridge circuits; circuit testing; logic testing; crosstalk targets; test generation; weak resistive bridges testing; Bridge circuits; Circuit faults; Circuit testing; Crosstalk; Delay; Logic testing; Runtime; Semiconductor device testing; System testing; Timing;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.261030
