• DocumentCode
    2904186
  • Title

    A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency

  • Author

    Renovell, M. ; Comte, M. ; Polian, I. ; Engelke, P. ; Becker, B.

  • Author_Institution
    LIRMM-UMR, Montpellier
  • fYear
    2006
  • fDate
    Nov. 2006
  • Firstpage
    273
  • Lastpage
    278
  • Abstract
    This paper analyzes the electrical behaviour of resistive opens as a function of their unpredictable resistance. It is demonstrated that the electrical behaviour depends on the value of the open resistance. It is also shown that detection of the open by a given vector Ti recursively depends on all the vectors that have been applied to the circuit before Ti. An electrical analysis of this recursive effect is presented and a specific ATPG strategy is proposed
  • Keywords
    automatic test pattern generation; electric resistance; logic testing; ATPG; electrical analysis; electrical behaviour; open resistance; recursive effect; resistive opens; sequence recursive dependency; unpredictable resistance; Automatic test pattern generation; Circuit faults; Circuit simulation; Circuit testing; Context modeling; Costs; Electric resistance; Integrated circuit modeling; Integrated circuit technology; Power system reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.261031
  • Filename
    4030779
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2904186