• DocumentCode
    2904351
  • Title

    Functional Test Generation for Sequential Circuits

  • Author

    Jacob, James ; Agrawal, Vishwani D.

  • Author_Institution
    Indian Institute of Science
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    17
  • Lastpage
    24
  • Keywords
    Automata; Circuit faults; Circuit synthesis; Circuit testing; Combinational circuits; Logic arrays; Logic testing; Programmable logic arrays; Sequential analysis; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658015
  • Filename
    658015
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2904351