Title :
Expansion of Convolutional Compactors over Galois Field
Author :
Arai, Masayuki ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko
Author_Institution :
Tokyo Metropolitan Univ.
Abstract :
Convolutional compactors offer a promising technique of compacting test responses. In this study the authors expand the architecture of convolutional compactor onto a Galois field in order to improve compaction ratio as well as reduce X-masking probability, namely, the probability that an error is masked by unknown values. While each scan chain is independently connected by EOR gates in the conventional arrangement, the proposed scheme treats q signals as an element over GF (2q), and the connections are configured on the same field. The authors show the arrangement of the proposed compactors and the equivalent expression over GF (2). The authors then evaluate the effectiveness of the proposed expansion in terms of X-masking probability by simulations with uniform distribution of X-values, as well as reduction of hardware overheads. Furthermore, the authors evaluate a multi-weight arrangement of the proposed compactors for non-uniform X distributions
Keywords :
Galois fields; built-in self test; error statistics; logic gates; EOR gates; Galois field; X-masking probability; compacting test responses; convolutional compactors; error probability; multiweight arrangement; nonuniform X distributions; uniform distribution; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Error analysis; Galois fields; Hardware; Logic circuits; Shift registers;
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
Print_ISBN :
0-7695-2628-4
DOI :
10.1109/ATS.2006.260962