DocumentCode
2904614
Title
Expansion of Convolutional Compactors over Galois Field
Author
Arai, Masayuki ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko
Author_Institution
Tokyo Metropolitan Univ.
fYear
2006
fDate
20-23 Nov. 2006
Firstpage
401
Lastpage
408
Abstract
Convolutional compactors offer a promising technique of compacting test responses. In this study the authors expand the architecture of convolutional compactor onto a Galois field in order to improve compaction ratio as well as reduce X-masking probability, namely, the probability that an error is masked by unknown values. While each scan chain is independently connected by EOR gates in the conventional arrangement, the proposed scheme treats q signals as an element over GF (2q), and the connections are configured on the same field. The authors show the arrangement of the proposed compactors and the equivalent expression over GF (2). The authors then evaluate the effectiveness of the proposed expansion in terms of X-masking probability by simulations with uniform distribution of X-values, as well as reduction of hardware overheads. Furthermore, the authors evaluate a multi-weight arrangement of the proposed compactors for non-uniform X distributions
Keywords
Galois fields; built-in self test; error statistics; logic gates; EOR gates; Galois field; X-masking probability; compacting test responses; convolutional compactors; error probability; multiweight arrangement; nonuniform X distributions; uniform distribution; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Error analysis; Galois fields; Hardware; Logic circuits; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location
Fukuoka
ISSN
1081-7735
Print_ISBN
0-7695-2628-4
Type
conf
DOI
10.1109/ATS.2006.260962
Filename
4030798
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