• DocumentCode
    2904614
  • Title

    Expansion of Convolutional Compactors over Galois Field

  • Author

    Arai, Masayuki ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko

  • Author_Institution
    Tokyo Metropolitan Univ.
  • fYear
    2006
  • fDate
    20-23 Nov. 2006
  • Firstpage
    401
  • Lastpage
    408
  • Abstract
    Convolutional compactors offer a promising technique of compacting test responses. In this study the authors expand the architecture of convolutional compactor onto a Galois field in order to improve compaction ratio as well as reduce X-masking probability, namely, the probability that an error is masked by unknown values. While each scan chain is independently connected by EOR gates in the conventional arrangement, the proposed scheme treats q signals as an element over GF (2q), and the connections are configured on the same field. The authors show the arrangement of the proposed compactors and the equivalent expression over GF (2). The authors then evaluate the effectiveness of the proposed expansion in terms of X-masking probability by simulations with uniform distribution of X-values, as well as reduction of hardware overheads. Furthermore, the authors evaluate a multi-weight arrangement of the proposed compactors for non-uniform X distributions
  • Keywords
    Galois fields; built-in self test; error statistics; logic gates; EOR gates; Galois field; X-masking probability; compacting test responses; convolutional compactors; error probability; multiweight arrangement; nonuniform X distributions; uniform distribution; Built-in self-test; Circuit faults; Circuit testing; Compaction; Convolution; Error analysis; Galois fields; Hardware; Logic circuits; Shift registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.260962
  • Filename
    4030798