DocumentCode
2904658
Title
Identification of a chemical process reactor using soft computing techniques
Author
Al-Hiary, Heba ; Braik, Malik ; Sheta, Alaa ; Ayesh, Aladdin
Author_Institution
Dept. of Inf. Technol., Al-Balqa Appl. Univ., Amman
fYear
2008
fDate
1-6 June 2008
Firstpage
845
Lastpage
853
Abstract
This paper discusses the application of artificial neural networks (ANNs) in the area of identification and control of nonlinear dynamical systems. Since chemical processes are getting more complex and complicated, the need of schemes that can improve process operations is highly demanded. ANNs are capable of learning from examples, perform non-linear mappings, and have a special capacity to approximate the dynamics of nonlinear systems in many applications. This paper describe the application of neural network for modeling reactor level, reactor pressure, reactor cooling water temperature, and reactor temperature problems in the Tennessee Eastman (TE) chemical process reactor. The potential of neural network technology in the process industries is great. Its ability to model process dynamics makes it powerful tool for modeling and control processes. A comparison between the applications of ANNs to model the TE plant is compared with other soft computing techniques like fuzzy logic (FL) and adaptive neuro-fuzzy inference systems (ANFIS).
Keywords
chemical reactors; neurocontrollers; nonlinear control systems; nonlinear dynamical systems; process control; Tennessee Eastman; artificial neural networks; chemical process reactor; nonlinear dynamical systems control; process industries; reactor cooling water temperature modeling; reactor level modeling; reactor pressure modeling; soft computing techniques; Artificial neural networks; Chemical processes; Control systems; Fuzzy logic; Inductors; Neural networks; Nonlinear control systems; Power system modeling; Tellurium; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Fuzzy Systems, 2008. FUZZ-IEEE 2008. (IEEE World Congress on Computational Intelligence). IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1098-7584
Print_ISBN
978-1-4244-1818-3
Electronic_ISBN
1098-7584
Type
conf
DOI
10.1109/FUZZY.2008.4630469
Filename
4630469
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