Title : 
Testing Hierarchical Network-on-Chip Systems with Hard Cores Using Bandwidth Matching and On-Chip Variable Clocking
         
        
        
            Author_Institution : 
Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE
         
        
        
        
        
        
            Abstract : 
In this paper, the paper presents a testing scheme for hierarchical network-on-a-chip (NoC) system consisting of hard embedded cores using bandwidth matching. The authors show how bandwidth matching and on-chip clocking techniques can be used in NoC to adapt the hard cores to the network channel width. The authors use a cost function to represent the tradeoff between test time and area overhead. In case of a hierarchical architecture, the authors show that various configurations of a core can be modelled as a set of rectangles and rectangle packing can be used for optimized TAM design. Experimental results show that the proposed method can significantly reduce the overall cost
         
        
            Keywords : 
clocks; integrated circuit testing; logic testing; network-on-chip; NoC system; bandwidth matching; cost function; hard embedded cores; hierarchical testing; network-on-chip systems; on-chip variable clocking; Bandwidth; Clocks; Computer networks; Cost function; Design optimization; Electronic equipment testing; Network-on-a-chip; Routing; System testing; System-on-a-chip;
         
        
        
        
            Conference_Titel : 
Test Symposium, 2006. ATS '06. 15th Asian
         
        
            Conference_Location : 
Fukuoka
         
        
        
            Print_ISBN : 
0-7695-2628-4
         
        
        
            DOI : 
10.1109/ATS.2006.260966