DocumentCode :
2904736
Title :
Testing Hierarchical Network-on-Chip Systems with Hard Cores Using Bandwidth Matching and On-Chip Variable Clocking
Author :
Liu, Chunsheng
Author_Institution :
Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE
fYear :
2006
fDate :
Nov. 2006
Firstpage :
431
Lastpage :
436
Abstract :
In this paper, the paper presents a testing scheme for hierarchical network-on-a-chip (NoC) system consisting of hard embedded cores using bandwidth matching. The authors show how bandwidth matching and on-chip clocking techniques can be used in NoC to adapt the hard cores to the network channel width. The authors use a cost function to represent the tradeoff between test time and area overhead. In case of a hierarchical architecture, the authors show that various configurations of a core can be modelled as a set of rectangles and rectangle packing can be used for optimized TAM design. Experimental results show that the proposed method can significantly reduce the overall cost
Keywords :
clocks; integrated circuit testing; logic testing; network-on-chip; NoC system; bandwidth matching; cost function; hard embedded cores; hierarchical testing; network-on-chip systems; on-chip variable clocking; Bandwidth; Clocks; Computer networks; Cost function; Design optimization; Electronic equipment testing; Network-on-a-chip; Routing; System testing; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2006. ATS '06. 15th Asian
Conference_Location :
Fukuoka
ISSN :
1081-7735
Print_ISBN :
0-7695-2628-4
Type :
conf
DOI :
10.1109/ATS.2006.260966
Filename :
4030802
Link To Document :
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