• DocumentCode
    2904736
  • Title

    Testing Hierarchical Network-on-Chip Systems with Hard Cores Using Bandwidth Matching and On-Chip Variable Clocking

  • Author

    Liu, Chunsheng

  • Author_Institution
    Dept. of Comput. & Electron. Eng., Nebraska-Lincoln Univ., Omaha, NE
  • fYear
    2006
  • fDate
    Nov. 2006
  • Firstpage
    431
  • Lastpage
    436
  • Abstract
    In this paper, the paper presents a testing scheme for hierarchical network-on-a-chip (NoC) system consisting of hard embedded cores using bandwidth matching. The authors show how bandwidth matching and on-chip clocking techniques can be used in NoC to adapt the hard cores to the network channel width. The authors use a cost function to represent the tradeoff between test time and area overhead. In case of a hierarchical architecture, the authors show that various configurations of a core can be modelled as a set of rectangles and rectangle packing can be used for optimized TAM design. Experimental results show that the proposed method can significantly reduce the overall cost
  • Keywords
    clocks; integrated circuit testing; logic testing; network-on-chip; NoC system; bandwidth matching; cost function; hard embedded cores; hierarchical testing; network-on-chip systems; on-chip variable clocking; Bandwidth; Clocks; Computer networks; Cost function; Design optimization; Electronic equipment testing; Network-on-a-chip; Routing; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 2006. ATS '06. 15th Asian
  • Conference_Location
    Fukuoka
  • ISSN
    1081-7735
  • Print_ISBN
    0-7695-2628-4
  • Type

    conf

  • DOI
    10.1109/ATS.2006.260966
  • Filename
    4030802