• DocumentCode
    2904884
  • Title

    Modeling and Simulation of Laser Lift-off Process for LED´s Substrates

  • Author

    Tan, Liuxi ; Li, Jia ; Liu, Sheng

  • Author_Institution
    Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    As high power LEDs develop rapidly, sapphire substrate on which LED\´s chips are grown, cannot meet the needs of the increasing performance any longer. Therefore, transfer of the devices from the former sapphire substrates to more thermally and electrically conductive receptor substrates is recommended. Laser peeling has been a new technology of separating films of GaN from the substrate on which they are grown. Experience shows that the films can be debonded intactly when the laser parameters are well controlled. In this contribution, the mechanics of the laser-assisted debonding of GaN films on sapphire, silicon and copper substrates is considered so that the specific parameters can be optimized in order to achieve a feasible process scheme that may be used in the industry. During the simulation, the knowledge of interfacial crack generation between dissimilar materials is considered to be the essential principle of the process of "liftoff". Failure of the interfaces results in the debonding. Whatever, the films of chips should not be damaged in the duration of the "lift-off" process. A few important issues such as temperature distribution, stress distribution and energy release rate are raised in terms of examining whether the films are likely to be damaged.
  • Keywords
    II-VI semiconductors; copper; elemental semiconductors; failure analysis; fracture mechanics; gallium compounds; laser beam effects; laser materials processing; light emitting diodes; power semiconductor diodes; sapphire; semiconductor thin films; silicon; stress analysis; substrates; surface cracks; surface treatment; temperature distribution; wide band gap semiconductors; Al2O3; Cu; GaN; Si; copper substrates; energy release rate; high power LED; interface failure; interfacial crack generation; laser lift-off process; laser peeling; laser-assisted debonding; sapphire substrate; silicon substrates; stress distribution; temperature distribution; Copper; Gallium nitride; Laser modes; Light emitting diodes; Metals industry; Optical control; Rapid thermal processing; Semiconductor films; Silicon; Thermal conductivity; LED; debonding; energy release rate; laser; lift-off;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441496
  • Filename
    4441496