Title :
Collapsed regime operation of capacitive micromachined ultrasonic transducers based on wafer-bonding technique
Author :
Huang, Y. ; Haeggström, E. ; Bayram, B. ; Zhuang, X. ; Ergun, A.S. ; Cheng, C.H. ; Khuri-Yakub, B.T.
Author_Institution :
Edward L. Ginzton Lab., Standford Univ., Stanford, CA, USA
Abstract :
We report experimental results from collapsed regime operation of the capacitive micromachined ultrasonic transducers (cMUTs) fabricated by a wafer bonding technique. The results show that a cMUT operating in the collapsed regime produces a maximal output pressure higher than a cMUT operating in the precollapse regime at 90% of its collapse voltage, 1.79kPa/V vs. 9.72 kPa/V at 2.3 MHz. in collapsed regime operation the fractional bandwidth (pulse-echo) is increased compared to that obtained in precollapsed regime operation 140% vs 83% with a bias 90% of the collapse voltage. Characterization of 1-D cMUT arrays operating in oil was done by ultrasonic pulse echo and pitch catch measurements.
Keywords :
capacitive sensors; micromachining; semiconductor device testing; ultrasonic transducers; wafer bonding; 2.3 MHz; capacitive micromachined ultrasonic transducers; collapse voltage; collapsed regime operation; pitch catch measurements; precollapse regime; ultrasonic pulse echo; wafer bonding; Acoustic transducers; Bandwidth; Biomembranes; Capacitance; Circuit simulation; Electrodes; Pulse measurements; Ultrasonic transducer arrays; Ultrasonic transducers; Voltage;
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
DOI :
10.1109/ULTSYM.2003.1293107