• DocumentCode
    2904974
  • Title

    Numerical Study on the Effects of Bond Parameters on Thermosonic Bond Strength

  • Author

    He, Jun ; Guo, Yongjin ; Lin, Zhongqin

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Thermosonic ball bonding is a popular joining technique in microelectronic interconnect. In this paper, the effects of bonding parameters on the bond strength are investigated mainly using the finite element method. The complete ball bonding process including both the impact and ultrasonic vibration stages is modeled, and the strain rate sensitivity of the gold ball and pad is considered. Five variables were defined to establish the relationship between bonding interfacial deformation and bond strength: the segment extension epsivi, the ratio of segment extension ki, the contact ratio S, the sum of segment extensions in bond interface Sigmaepsivi , and the ratio of the sum of segment extensions k . It was found that the bond strength at the bond interface increases from the center to edge; the bond strength increases with the growth of the initial impact velocity; the bond strength increases firstly with the increasing of the bonding time, then decreases; and there exists an appropriate temperature to let the bond strength to be maximum. Finally, the simulation is compared with the experimental results.
  • Keywords
    deformation; finite element analysis; gold; integrated circuit interconnections; lead bonding; Au; bonding interfacial deformation; finite element method; gold ball bonding process; integrated circuits interconnections; microelectronic interconnects; strain rate sensitivity; thermosonic ball bonding parameters; thermosonic bond strength; ultrasonic vibration; Bonding forces; Bonding processes; Capacitive sensors; Finite element methods; Gold; Integrated circuit interconnections; Raw materials; Surface cleaning; Temperature; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441500
  • Filename
    4441500