DocumentCode
2904990
Title
Two-Photon Absorption (TPA) backside pulsed laser tests in the LM324
Author
López-Calle, I. ; Franco, F.J. ; Izquierdo, J.G. ; Agapito, J.A.
Author_Institution
Dept. de Fis. Aplic. III, Univ. Complutense de Madrid, Madrid, Spain
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
138
Lastpage
143
Abstract
Experiments to obtain XY scans on the surface of an amplifier at different depths and energy values were performed at the UCM, the results of which are shown and discussed in this paper.
Keywords
absorption; operational amplifiers; two-photon processes; LM324; TPA backside pulsed laser test; UCM; operational amplifier; surface XY scan; two-photon absorption backside pulsed laser test; Absorption; Lasers; Measurement by laser beam; Photonics; Radiation effects; Transient analysis; Transistors; LM324; Laser; Operational Amplifiers; Single Event Transients; Two-Photon Tests;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location
Bruges
ISSN
0379-6566
Print_ISBN
978-1-4577-0492-5
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2009.5994568
Filename
5994568
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