Title :
An approach to single event testing of SDRAMs
Author :
Adell, Philippe C. ; Edmonds, Larry ; McPeak, Richard ; Scheick, Leif ; McClure, Steve S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A testing approach based on error-pattern identification with a graphical mapping and color-coding of the full SDRAM during single-event characterization is proposed. Results about unique SEFI modes and the role of temperature are discussed.
Keywords :
DRAM chips; electron device testing; SDRAM; SEFI mode; color coding; error-pattern identification; graphical mapping; single event testing; single-event characterization; Registers; SDRAM; Temperature dependence; Temperature distribution; Temperature measurement; Temperature sensors; Testing; SDRAMs; Single Event Effects; micro-displacement; stuck bits;
Conference_Titel :
Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-0492-5
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2009.5994572
