• DocumentCode
    2905095
  • Title

    Application of Robust Design on the Optimal Process Design of Thermo-mechanical Reliability of PBGA Solder Joint

  • Author

    Xiao, Xiaoqing ; Zhou, Jicheng ; En, Yunfei ; Chen, Ni

  • Author_Institution
    Central South Univ., Changsha
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Based on robust design (Taguchi method) and finite element method (FEM). the thermo-mechanical reliability of plastic ball grid array (PBGA) solder joint subject to an accelerated thermal cycling test condition is studied. Including PCB size, substrate thickness, die coefficient of thermal expansion (CTE). and solder joint CTE et al. 8 different control factors are considered for a robust design towards enhancement of the thermal fatigue resistance of solder joint by using a mixed-level orthogonal array. From the results, importance of these factors on the thermo-mechanical reliability of PBGA solder joint is ranked. The best parameter combination is A1B2C3D1E2F1G3H1 in which the substrate CTE. solder joint CTE. the thickness of substrate, die CTE are the most important. The optimal design, after the comparative experiment with ANN (artificial neural network) and conformation experiment, has remarkable enhancement in thermo-mechanical reliability compared with the original design.
  • Keywords
    Taguchi methods; ball grid arrays; electronic engineering computing; finite element analysis; neural nets; plastic packaging; printed circuit design; reliability; soldering; thermal expansion; thermal resistance; thermal stress cracking; ANN; FEM; PBGA solder joint; PCB; Taguchi method; accelerated thermal cycling test; artificial neural network; die coefficient of thermal expansion; finite element method; mixed-level orthogonal array; optimal process design; plastic ball grid array; thermal fatigue resistance; thermo-mechanical reliability; Artificial neural networks; Design methodology; Electronics packaging; Finite element methods; Plastics; Process design; Robustness; Soldering; Thermal resistance; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441508
  • Filename
    4441508