DocumentCode
2905168
Title
A Switch-Level Test Generation System
Author
Einspahr, Kent L. ; Seth, Sharad C.
Author_Institution
University of Nebraska
fYear
1992
fDate
4-7 Jan 1992
Firstpage
43
Lastpage
48
Keywords
Circuit faults; Circuit simulation; Circuit testing; Clocks; Logic testing; Sequential analysis; Sequential circuits; Switching circuits; Synchronous generators; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN
1063-9667
Print_ISBN
0-8186-2465-5
Type
conf
DOI
10.1109/ICVD.1992.658019
Filename
658019
Link To Document