DocumentCode :
2905168
Title :
A Switch-Level Test Generation System
Author :
Einspahr, Kent L. ; Seth, Sharad C.
Author_Institution :
University of Nebraska
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
43
Lastpage :
48
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Clocks; Logic testing; Sequential analysis; Sequential circuits; Switching circuits; Synchronous generators; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658019
Filename :
658019
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2905168
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