A Monte Carlo-based control signal generator for single event effetc (SEE) fault injection

In this paper a single event effect (SEE) fault injection control signal generator based on Monte Carlo method is proposed. Fault control signal generated by the traditional SEE fault injection emulation method for VLSI does not take the speciality of the space environment and the electrical characteristics of the circuit into account. Whereas the signal generator presented in this paper takes advantage of the Monte Carlo method to perform curve fitting on the space particle sample data, as well as to evaluate the circuit node capacitance characteristics and the deposit energy of multiple incidence angles, thereby overcomes the two aspects of disadvantages mentioned before and makes the fault injection emulation approach closer to the real SEE. At the same time C# program and FPGA hardware accelerated emulation are introduced to improve the speed and efficiency of the fault injection control signal generation which makes the proposed generator suitable for generating fault control signal of SEE fault injection emulation.