• DocumentCode
    2905507
  • Title

    Effect of Solder Volume on Shear Strength between Sn-3.0Ag-0.5Cu Solder and Cu Metallization

  • Author

    Shihua, Yang ; Pengrong, Lin ; Yanhong, Tian ; Chunqing, Wang ; Le, Liang ; Qian, Wang

  • Author_Institution
    Harbin Inst. of Technol., Harbin
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Shear behavior of Sn-3.0Ag-0.5Cu solder joints on ball grid array substrates was investigated with different solder volumes and shear speeds to study the solder volume effect on shear properties. Both solder volume and shear speed were found to have strong effect on the shear strength. The shear force decreases obviously with the decrease of the solder volume due to the significant decrease of loaded area, while the shear strength has reverse trend. The shear strength increases sharply with the decrease of solder volume as a result of the discrepancy of interfacial reaction and microstructure. And the shear strength increases rapidly with the increase in shear speed due to the limited grain boundaries or interphase boundaries sliding and dislocation movement. After the shear test, fracture surfaces were investigated by canning electron microscopy equipped with energy dispersed x ray and it was found that the fracture mode of as-reflowed solder joints was primary ball cut within the bulk solder near the interface with a ductile rupture. The results suggest that even if the solder shear tests showed the same fracture mechanism, solder volume still has great effect on the shear properties at different shear speeds.
  • Keywords
    copper; copper alloys; metallisation; shear strength; silver alloys; solders; tin alloys; Cu; Sn-3.0Ag-0.5Cu solder; SnAgCu; ball grid array; copper metallization; shear properties; shear strength; solder joints; solder volume; Canning; Electron microscopy; Electronics packaging; Grain boundaries; Mechanical factors; Metallization; Microstructure; Soldering; Surface cracks; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441532
  • Filename
    4441532