DocumentCode :
2905526
Title :
On Bridging Faults in ECL Circuits
Author :
MenIon, S.M. ; Jayasumana, Anura P. ; Malaiya, Yashwant K.
Author_Institution :
Colorado State University
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
55
Lastpage :
60
Keywords :
Circuit faults; Computer science; Costs; Digital circuits; Feedback; Integrated circuit manufacture; Logic devices; MOS devices; Power dissipation; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658021
Filename :
658021
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2905526
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