DocumentCode :
2905527
Title :
A customizable voltage behind reactance squirrel cage induction machine model for PSCAD/EMTDC
Author :
Wiedeback, N.J. ; Johnson, B.K. ; Law, J.D. ; Hess, H.L.
Author_Institution :
Univ. of Idaho, Moscow, ID, USA
fYear :
2011
fDate :
15-18 May 2011
Firstpage :
1569
Lastpage :
1574
Abstract :
Electromagnetic transient programs such as PSCAD/EMTDC provides engineers and researchers with the ability to model power systems quickly and efficiently. When modeling custom motor installations users may find the included motor models to be inadequate for their modeling case due to limitations in configurability of winding connections. In the interest of producing a model which behaves similarly to a real machine, and creating the most efficient interface between the network and machine several methods have been developed. Recently a voltage behind reactance method has been proposed for modeling machines that has been shown to have improved performance over traditional methods. This paper presents the theory behind the construction and documents the implementation of a voltage behind reactance machine model in the PSCAD/EMTDC environment. Special attention is paid to areas where the model can be customized by future users. Details regarding the layout and design of the model in PSCAD/EMTDC and a comparison of results to the asynchronous machine of the SimPowerSystems package for Simulink are given as well.
Keywords :
EMTP; squirrel cage motors; PSCAD-EMTDC; SimPowerSystems package; Simulink; asynchronous machine; electromagnetic transient programs; motor installations; power system modeling; reactance squirrel cage induction machine model; voltage behind reactance machine model; winding connections; EMTDC; Equations; Mathematical model; PSCAD; Rotors; Stator windings; Electromagnetic Transient Simulation Program (EMTP); induction machine; stator windings; voltage behind reactance model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electric Machines & Drives Conference (IEMDC), 2011 IEEE International
Conference_Location :
Niagara Falls, ON
Print_ISBN :
978-1-4577-0060-6
Type :
conf
DOI :
10.1109/IEMDC.2011.5994595
Filename :
5994595
Link To Document :
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