Title : 
Oxidation failure of Lead Frame Copper alloys with Surface Electroplated Pure Cu
         
        
            Author : 
Chen, Xi ; Hu, Anmin ; Li, Ming ; Shen, Hong ; Mao, Dali
         
        
            Author_Institution : 
Shanghai Jiao Tong Univ., Shanghai
         
        
        
        
        
        
            Abstract : 
Influence of surface electroplated pure copper on oxidation failure of lead frame copper alloys for IC package were investigate. Pure copper layer will benefit the diffusion of copper ion, so the thickness of copper oxide films increase but the velocity of CuO formation decrease and the oxidation only occurs at pure copper layer. As electroplating pure copper layer on copper alloy exceed a critical thickness, surface electroplating treatment can improve copper alloy´s resistance against oxidation failure greatly. The oxide film structure of copper alloys is CuO/Cu2O/Cu substrate, after electroplate treated, and the oxide film structure change to CuO (no or trace)/Cu2O/Cu. The oxide films with only Cu2O have higher adhesion strengths.
         
        
            Keywords : 
copper; copper compounds; electroplating; integrated circuit packaging; oxidation; semiconductor device packaging; CuO-Cu2O-Cu; integrated circuit package; lead frame copper alloys; oxidation failure; oxidation resistance; pure copper; surface electroplating; Adhesives; Coatings; Copper alloys; Lead compounds; Materials science and technology; Oxidation; Semiconductor device packaging; Semiconductor films; Surface resistance; Temperature;
         
        
        
        
            Conference_Titel : 
Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
         
        
            Conference_Location : 
Shanghai
         
        
            Print_ISBN : 
978-1-4244-1392-8
         
        
            Electronic_ISBN : 
978-1-4244-1392-8
         
        
        
            DOI : 
10.1109/ICEPT.2007.4441545