• DocumentCode
    2905894
  • Title

    The Technique Research on FBP

  • Author

    Liang, Zhizhong ; Tao, Yujuan ; Qian, Ying

  • Author_Institution
    Jiangsu Changjiang Electron. Technol. Co., Ltd., Jiangyin
  • fYear
    2007
  • fDate
    14-17 Aug. 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Summary form only given. As the development of semiconductor manufacturing technology, it will force the packaging technology to develop correspondingly to meet the requests of different IC functions. FBP (Flat Bump Package), designed by JCET, is the package to meet those requests with its high thermal/electrical performance, low interference, strong joint strength and excellent reliability. Furthermore FBP is suitable for many dices such as diode, dynatron, field effect transistors, power IC, RF IC, logic IC, memory IC, driver IC, power management IC and so on. Compared with other leadless packages like QFN/DFN/BCC. FBP has mam improvements like option for epoxy /soft solder/eutectic, no resin bleeding issue, strip testing capability, excellent bond-ability in SMT, die pad mounting to motherboard, low package thickness profile (down to 0.35mm), high I/O capacity (400, 1-3 rows of leads), MCM and embedded passives capability, flexible configuration options and excellent electrical/thermal performance. FBP is JECT patent technology. There are more than 30 patents on FBP domestically and internationally, and more than 10 patents have been authorized by State Intellectual Property Office of P.R.C. In this paper, the special structure and excellent performance of FBP are introduced, described and illustrated graphically.
  • Keywords
    integrated circuit packaging; integrated circuit reliability; FBP research; IC packaging; IC reliability; JECT patent technology; flat bump package; semiconductor manufacturing technology; thermal/electrical performance; FET integrated circuits; Integrated circuit packaging; Interference; Lead; Power integrated circuits; Radio frequency; Radiofrequency integrated circuits; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor diodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology, 2007. ICEPT 2007. 8th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-1392-8
  • Electronic_ISBN
    978-1-4244-1392-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2007.4441560
  • Filename
    4441560