Title :
21st IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems - Title
Abstract :
The following topics are dealt with: VLSI system; defect tolerance; error correction; reliability evaluation and analysis; fault tolerant designs; test and diagnosis; soft errors; test compression; processor checking and jitter
Keywords :
VLSI; built-in self test; fault diagnosis; integrated circuit testing; jitter; logic circuits; logic testing; reliability; VLSI system; circuit jitter; defect tolerance; error correction; fault diagnosis; fault tolerant designs; processor checking; reliability analysis; reliability evaluation; soft errors; test compression;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2006. DFT '06. 21st IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7695-2706-X
