• DocumentCode
    2906584
  • Title

    A novel solution for chip-level functional timing verification

  • Author

    Jayabharathi, Rathish ; Lee, Kyung Tek ; Abraham, Jacob A.

  • Author_Institution
    Dept. of Design Technol., Intel Corp., Folsom, CA, USA
  • fYear
    1997
  • fDate
    27 Apr-1 May 1997
  • Firstpage
    137
  • Lastpage
    142
  • Abstract
    Existing timing verification tools can provide methodologies for identifying and optimizing critical true paths in a embedded combinational module; however the problem of justifying these paths to the chip level is a very difficult one. This paper addresses the problem of timing verification at the entire chip level. We use a critical path tool, CRITIC, to obtain critical paths in an embedded combinational module. In order to reduce the complexity of checking whether the module-level critical path is indeed critical at the chip level, we use techniques from formal verification to extract the control behavior of the circuit, and check whether there is any control sequence which will justify the path to the chip level. The results of the experiments on several processor designs show that our approach is very effective in large sequential circuits such as microprocessors, where conventional ATPG techniques require inordinate amounts of CPU time. The experiments also show that the execution time remains reasonable as the circuit size increases, since we deal with a reduced control space rather than the entire state space of the circuit
  • Keywords
    automatic test software; circuit optimisation; combinational circuits; computer testing; critical path analysis; design for testability; formal verification; integrated circuit testing; logic CAD; logic testing; timing; CRITIC tool; automated procedure; chip-level functional timing verification; control behavior; critical path tool; embedded combinational module; entire chip level; extracted flow control machine; formal verification; large sequential circuits; microprocessors; reduced control space; vigorous sensitization; Automatic test pattern generation; Central Processing Unit; Formal verification; Microprocessors; Optimization methods; Process design; Sequential circuits; Size control; State-space methods; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1997., 15th IEEE
  • Conference_Location
    Monterey, CA
  • ISSN
    1093-0167
  • Print_ISBN
    0-8186-7810-0
  • Type

    conf

  • DOI
    10.1109/VTEST.1997.599465
  • Filename
    599465