DocumentCode :
2906584
Title :
A novel solution for chip-level functional timing verification
Author :
Jayabharathi, Rathish ; Lee, Kyung Tek ; Abraham, Jacob A.
Author_Institution :
Dept. of Design Technol., Intel Corp., Folsom, CA, USA
fYear :
1997
fDate :
27 Apr-1 May 1997
Firstpage :
137
Lastpage :
142
Abstract :
Existing timing verification tools can provide methodologies for identifying and optimizing critical true paths in a embedded combinational module; however the problem of justifying these paths to the chip level is a very difficult one. This paper addresses the problem of timing verification at the entire chip level. We use a critical path tool, CRITIC, to obtain critical paths in an embedded combinational module. In order to reduce the complexity of checking whether the module-level critical path is indeed critical at the chip level, we use techniques from formal verification to extract the control behavior of the circuit, and check whether there is any control sequence which will justify the path to the chip level. The results of the experiments on several processor designs show that our approach is very effective in large sequential circuits such as microprocessors, where conventional ATPG techniques require inordinate amounts of CPU time. The experiments also show that the execution time remains reasonable as the circuit size increases, since we deal with a reduced control space rather than the entire state space of the circuit
Keywords :
automatic test software; circuit optimisation; combinational circuits; computer testing; critical path analysis; design for testability; formal verification; integrated circuit testing; logic CAD; logic testing; timing; CRITIC tool; automated procedure; chip-level functional timing verification; control behavior; critical path tool; embedded combinational module; entire chip level; extracted flow control machine; formal verification; large sequential circuits; microprocessors; reduced control space; vigorous sensitization; Automatic test pattern generation; Central Processing Unit; Formal verification; Microprocessors; Optimization methods; Process design; Sequential circuits; Size control; State-space methods; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1997., 15th IEEE
Conference_Location :
Monterey, CA
ISSN :
1093-0167
Print_ISBN :
0-8186-7810-0
Type :
conf
DOI :
10.1109/VTEST.1997.599465
Filename :
599465
Link To Document :
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